-
Varistor silicon_carbide Filter Heating Oxide MoS2 Force-distance SiliconeOxide PinpointNanomechanicalMode Chrome Edwin Modulus oxide_layer HiVacuum Conductivity Pyroelectric Memory TemperatureControlledAFM Microchannel light_emission fluorocarbon Nanopattern C_AFM Stiffness Conduct HardDiskMedia Ito Holes Logo MolybdenumDisulfide TemperatureControl China LeakageCurrent PinPointMode LateralPFM
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Fe-Nd-B
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact, TCS
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.5Hz
- Pixel: 512×256
- TCS: Temperature control stage type2