-
Foil Pipette HanyangUniv Reading Global_Comm Regensburg 3-hexylthiophene Al2O3 Calcite PvdfBead F14H20 Fe_film FastScan GaAs Patterns Water Bismuth StrontiuTitanate CVD Wonseok CuParticle Piezoelectric Lattice BTO Zagreb Liquid NanoLithography EFM Potential Array CuSubstrate molecule FrequencyModulation FrictionalForce temperature_control
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Tungsten coated wafer
Scanning Conditions
- System: NX10
- Scan Mode: NCM
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.3Hz
- Pixel: 512×5126